Novel Photoconductive Decay Measurement System
- Technology Benefits
- Main Advantages of this InventionΓÇó Fast data acquisition time.ΓÇó Provides a non-destructive means of measuring the lifetime of a variety of materialsΓÇó Performance exceeds those of current methodsΓÇó Has a greater range of applicability than the current method
- Technology Application
- Potential Areas of Application ΓÇó Photovoltaic industryΓÇó Microelectronic industryΓÇó Optoelectronic industry
- Detailed Technology Description
- None
- Supplementary Information
- Inventor: Ahrenkiel, Richard Keith | Dunlavy, Donald John
Priority Number: US8581613B2
IPC Current: G01R0031302
US Class: 32475431 | 32475423 | 32476201
Assignee Applicant: Colorado School of Mines,Golden
Title: Transmission-modulated photoconductive decay measurement system
Usefulness: Transmission-modulated photoconductive decay measurement system
Summary: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, such as materials used in fields, such as but are not limited to, microelectronic, optoelectronic and photovoltaic industries.
Novelty: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, has analyzing unit, which determines photocarrier recombination lifetime by analyzing received modified electromagnetic signal
- Industry
- Optics
- Sub Category
- Optical Fiber
- *Abstract
-
This invention provides a nondestructive, contactless means to measure the recombination of lifetime of a wide range of semiconducting and photoconducting materials. The device exceeds the performance and range of applicability of existing commercial products. It utilizes a novel system of radio frequency coils that allow for rapid data acquisition time with no contact of the sensitive photovoltaic material.
- *Principal Investigator
-
Name: Donald Dunlavy
Department:
Name: Richard Ahrenkiel
Department:
- Country/Region
- USA
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