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Novel Photoconductive Decay Measurement System

技術優勢

Main Advantages of this InventionΓÇó Fast data acquisition time.ΓÇó Provides a non-destructive means of measuring the lifetime of a variety of materialsΓÇó Performance exceeds those of current methodsΓÇó Has a greater range of applicability than the current method

技術應用

Potential Areas of Application ΓÇó Photovoltaic industryΓÇó Microelectronic industryΓÇó Optoelectronic industry

詳細技術說明

None

*Abstract

This invention provides a nondestructive, contactless means to measure the recombination of lifetime of a wide range of semiconducting and photoconducting materials. The device exceeds the performance and range of applicability of existing commercial products. It utilizes a novel system of radio frequency coils that allow for rapid data acquisition time with no contact of the sensitive photovoltaic material.

*Principal Investigation

Name: Donald Dunlavy

Department:

Name: Richard Ahrenkiel

Department:

附加資料

Inventor: Ahrenkiel, Richard Keith | Dunlavy, Donald John
Priority Number: US8581613B2
IPC Current: G01R0031302
US Class: 32475431 | 32475423 | 32476201
Assignee Applicant: Colorado School of Mines,Golden
Title: Transmission-modulated photoconductive decay measurement system
Usefulness: Transmission-modulated photoconductive decay measurement system
Summary: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, such as materials used in fields, such as but are not limited to, microelectronic, optoelectronic and photovoltaic industries.
Novelty: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, has analyzing unit, which determines photocarrier recombination lifetime by analyzing received modified electromagnetic signal

主要類別

光學

細分類別

光纖

國家/地區

美國