Novel Photoconductive Decay Measurement System
Main Advantages of this InventionΓÇó Fast data acquisition time.ΓÇó Provides a non-destructive means of measuring the lifetime of a variety of materialsΓÇó Performance exceeds those of current methodsΓÇó Has a greater range of applicability than the current method
Potential Areas of Application ΓÇó Photovoltaic industryΓÇó Microelectronic industryΓÇó Optoelectronic industry
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Inventor: Ahrenkiel, Richard Keith | Dunlavy, Donald John
Priority Number: US8581613B2
IPC Current: G01R0031302
US Class: 32475431 | 32475423 | 32476201
Assignee Applicant: Colorado School of Mines,Golden
Title: Transmission-modulated photoconductive decay measurement system
Usefulness: Transmission-modulated photoconductive decay measurement system
Summary: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, such as materials used in fields, such as but are not limited to, microelectronic, optoelectronic and photovoltaic industries.
Novelty: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, has analyzing unit, which determines photocarrier recombination lifetime by analyzing received modified electromagnetic signal
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