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Novel Photoconductive Decay Measurement System

Technology Benefits

Main Advantages of this InventionΓÇó Fast data acquisition time.ΓÇó Provides a non-destructive means of measuring the lifetime of a variety of materialsΓÇó Performance exceeds those of current methodsΓÇó Has a greater range of applicability than the current method

Technology Application

Potential Areas of Application ΓÇó Photovoltaic industryΓÇó Microelectronic industryΓÇó Optoelectronic industry

Detailed Technology Description

None

Supplementary Information

Inventor: Ahrenkiel, Richard Keith | Dunlavy, Donald John
Priority Number: US8581613B2
IPC Current: G01R0031302
US Class: 32475431 | 32475423 | 32476201
Assignee Applicant: Colorado School of Mines,Golden
Title: Transmission-modulated photoconductive decay measurement system
Usefulness: Transmission-modulated photoconductive decay measurement system
Summary: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, such as materials used in fields, such as but are not limited to, microelectronic, optoelectronic and photovoltaic industries.
Novelty: Photocarrier recombination lifetime measurement system for photoconductive or semiconductor sample material, has analyzing unit, which determines photocarrier recombination lifetime by analyzing received modified electromagnetic signal

Industry

Optics

Sub Group

Optical Fiber

Country/Region

USA

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