(DUAL PROBE) APPARATUS AND METHOD FOR NONDESTRUCTIVE TESTING AND EVALUATION OF COMPLEX COMPOSITE STRUCTURES INCLUDING A DUAL PROBE
METHOD AND APPARATUS FOR NONDESTRUCTIVE SAMPLE INSPECTION
None
Patent Number: US7190177B2
Application Number: US2004920723A
Inventor: Zoughi, Reza | Kharkivskiy, Sergiy | Ghasr, Mohammad Tayeb Ahmad
Priority Date: 18 Aug 2004
Priority Number: US7190177B2
Application Date: 18 Aug 2004
Publication Date: 13 Mar 2007
IPC Current: G01R002732
US Class: 324642 | 32475431 | 32476201 | 324763 | 324765
Assignee Applicant: The Curators of the University of Missourilumbia
Title: Method and apparatus for nondestructive sample inspection
Usefulness: Method and apparatus for nondestructive sample inspection
Summary: Used for inspecting a sample for defect e.g. microscopic corrosion pit.
Novelty: Sample defect e.g. microscopic corrosion pit, inspecting apparatus, has power splitter determining difference between signals reflected from sample, where defect is determined to exist when difference is found between signals
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Aug 18, 2004
7,190,177
美国
