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(DUAL PROBE) APPARATUS AND METHOD FOR NONDESTRUCTIVE TESTING AND EVALUATION OF COMPLEX COMPOSITE STRUCTURES INCLUDING A DUAL PROBE

標題

METHOD AND APPARATUS FOR NONDESTRUCTIVE SAMPLE INSPECTION

詳細技術說明

None

*Abstract

Abstract of US Patent 7,190,177 - Method and apparatus for nondestructive sample inspection: An apparatus for inspecting a sample for defects includes a signal generator for generating a signal and a device for splitting the signal into two separate signals which have substantially equal phase and magnitude. A sensor radiates the two signals on the sample and receives the two signals reflected from the sample. A device is provided for determining a difference between the two signals reflected from the sample without unwanted influence of variations of distance between the sensor and sample, and reflections from nearby sample edges and boundaries. A defect is determined to exist when a difference is found between the two reflected signals.Non-confidential Abstract of Invention: An apparatus and method for near-field microwave and millimeter wave nondestructive testing and evaluation of complex composite structures having a dual probe are disclosed. Two coherent microwave signals from a single source are transmitted to the dual probe transmitting these signals to the structure under inspection and receiving reflected signals from it. A difference of the reflected signals is transmitted to a detector in order to remove or reduce influence of standoff distance variation to increase sensitivity of the system. A type of the dual probe and its size provide increasing resolution of the system. An electrical distance between two apertures of the dual probe is provided for reducing and removing unwanted edge effects. Appropriate scanning and signal processing is used to provide for creating separate defect images from the dual probe and from each of its apertures to increase probability of defect detection and evaluation. This technique can detect many different types of defects in variety of complex composite structures.

*IP Issue Date

Mar 13, 2007

*Principal Investigation

Name: Sergiy Kharkivskiy, Res. Assoc Professor

Department:

Name: Reza Zoughi, Professor

Department:

Name: Mohammad Ghasr, Graduate Student - PhD

Department:

附加資料

Patent Number: US7190177B2
Application Number: US2004920723A
Inventor: Zoughi, Reza | Kharkivskiy, Sergiy | Ghasr, Mohammad Tayeb Ahmad
Priority Date: 18 Aug 2004
Priority Number: US7190177B2
Application Date: 18 Aug 2004
Publication Date: 13 Mar 2007
IPC Current: G01R002732
US Class: 324642 | 32475431 | 32476201 | 324763 | 324765
Assignee Applicant: The Curators of the University of Missourilumbia
Title: Method and apparatus for nondestructive sample inspection
Usefulness: Method and apparatus for nondestructive sample inspection
Summary: Used for inspecting a sample for defect e.g. microscopic corrosion pit.
Novelty: Sample defect e.g. microscopic corrosion pit, inspecting apparatus, has power splitter determining difference between signals reflected from sample, where defect is determined to exist when difference is found between signals

主要類別

測量/測試

細分類別

測量工具

申請日期

Aug 18, 2004

申請號碼

7,190,177

其他

國家/地區

美國