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(DUAL PROBE) APPARATUS AND METHOD FOR NONDESTRUCTIVE TESTING AND EVALUATION OF COMPLEX COMPOSITE STRUCTURES INCLUDING A DUAL PROBE

IP Title

METHOD AND APPARATUS FOR NONDESTRUCTIVE SAMPLE INSPECTION

Detailed Technology Description

None

Supplementary Information

Patent Number: US7190177B2
Application Number: US2004920723A
Inventor: Zoughi, Reza | Kharkivskiy, Sergiy | Ghasr, Mohammad Tayeb Ahmad
Priority Date: 18 Aug 2004
Priority Number: US7190177B2
Application Date: 18 Aug 2004
Publication Date: 13 Mar 2007
IPC Current: G01R002732
US Class: 324642 | 32475431 | 32476201 | 324763 | 324765
Assignee Applicant: The Curators of the University of Missourilumbia
Title: Method and apparatus for nondestructive sample inspection
Usefulness: Method and apparatus for nondestructive sample inspection
Summary: Used for inspecting a sample for defect e.g. microscopic corrosion pit.
Novelty: Sample defect e.g. microscopic corrosion pit, inspecting apparatus, has power splitter determining difference between signals reflected from sample, where defect is determined to exist when difference is found between signals

Industry

Measurement/Testing

Sub Group

Measurement Tool

Application Date

Aug 18, 2004

Application No.

7,190,177

Others

Country/Region

USA

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