High-Throughput And Label-Free Single Nanoparticle Sizing Based On Time-Resolved On-Chip Microscopy
Portable, low-cost, large-field of view technology allowing for high-throughput sample analysisTime-resolved measurements are significantly more reliableLarge dynamic range at various sample concentrations
UCLA researchers led by Prof. Aydogan Ozcan have developed a novel approach that combines holographic on-chip microscopy with vapor-condensed nanolens self-assembly technology inside a cost-effective hand-held device to size nanoparticles. Using this approach and capturing time-resolved in situ images of the particles results in a significant signal enhancement for the label-free detection in a large sample field-of-view. This high-throughput and label-free nanoparticle sizing platform will make highly advanced nanoscopic measurements readily accessible to researchers and technicians in developing countries, and might especially be valuable for environmental and biomedical applications.
20180052425
State Of Development Experimentally demonstrated the sizing of individual nanoparticles as well as viruses, monodisperse samples, and complex polydisperse mixtures, where the sample concentrations can span ∼5 orders-of-magnitude and particle sizes can range from 40 nm to millimeter-scale. Background The ability to detect and size nanoparticles is important in the analysis of liquid and aerosol samples for medical, biological, and environmental studies. For example, nanomaterial synthesis, air and water quality monitoring, and virology rely on the ability to size nanoparticles. Various nanoparticle detection and sizing methods are available however, there is a lack of high-throughput devices that can cover a large dynamic range of particle sizes within a portable, cost-effective and rapid technology. Existing methods are typically very accurate and provide a gold standard for particle sizing; though, they are bulky, slow, expensive, may require significant prior knowledge of sample identity, and provide extremely restricted fields of view (FOVs) which limit throughput for particle sizing. Related Materials Additional Technologies by these Inventors Tech ID/UC Case 27522/2015-476-0 Related Cases 2015-476-0
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