Search
  • 網站搜尋
亞洲知識產權資訊網為知識產權業界提供一個一站式網上交易平台,協助業界發掘知識產權貿易商機,並與環球知識產權業界建立聯繫。無論你是知識產權擁有者正在出售您的知識產權,或是製造商需要購買技術以提高操作效能,又或是知識產權配套服務供應商,你將會從本網站發掘到有用的知識產權貿易資訊。
返回搜索結果

High-Throughput And Label-Free Single Nanoparticle Sizing Based On Time-Resolved On-Chip Microscopy


技術優勢

Portable, low-cost, large-field of view technology allowing for high-throughput sample analysisTime-resolved measurements are significantly more reliableLarge dynamic range at various sample concentrations


詳細技術說明

UCLA researchers led by Prof. Aydogan Ozcan have developed a novel approach that combines holographic on-chip microscopy with vapor-condensed nanolens self-assembly technology inside a cost-effective hand-held device to size nanoparticles. Using this approach and capturing time-resolved in situ images of the particles results in a significant signal enhancement for the label-free detection in a large sample field-of-view. This high-throughput and label-free nanoparticle sizing platform will make highly advanced nanoscopic measurements readily accessible to researchers and technicians in developing countries, and might especially be valuable for environmental and biomedical applications.


申請號碼

20180052425


其他

State Of Development

Experimentally demonstrated the sizing of individual nanoparticles as well as viruses, monodisperse samples, and complex polydisperse mixtures, where the sample concentrations can span ∼5 orders-of-magnitude and particle sizes can range from 40 nm to millimeter-scale.


Background

The ability to detect and size nanoparticles is important in the analysis of liquid and aerosol samples for medical, biological, and environmental studies. For example, nanomaterial synthesis, air and water quality monitoring, and virology rely on the ability to size nanoparticles. Various nanoparticle detection and sizing methods are available however, there is a lack of high-throughput devices that can cover a large dynamic range of particle sizes within a portable, cost-effective and rapid technology. Existing methods are typically very accurate and provide a gold standard for particle sizing; though, they are bulky, slow, expensive, may require significant prior knowledge of sample identity, and provide extremely restricted fields of view (FOVs) which limit throughput for particle sizing.


Related Materials

High-throughput and label-free single nanoparticle sizing based on time-resolved on-chip microscopy. McLeod E, Dincer TU, Veli M, Ertas YN, Nguyen C, Luo W, Greenbaum A, Feizi A, Ozcan. ACS Nano. March 2015.


Additional Technologies by these Inventors


Tech ID/UC Case

27522/2015-476-0


Related Cases

2015-476-0


國家/地區

美國

欲了解更多信息,請點擊 這裡
Business of IP Asia Forum
桌面版