Methods and Devices for Measuring the shape of Sessile drops
- Detailed Technology Description
- Patent No.: 9,791,265The present invention relates to methods of determining shape parameters of sessile drops and to methods of measuring the wettability of a surface.
- *Abstract
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In one aspect, methods of determining the shape of a sessile drop are described herein. In some embodiments, a method described herein comprises measuring a first shape parameter of a sessile drop to obtain a first shape parameter value, measuring a second shape parameter of the drop to obtain a second shape parameter value, and using the first and second shape parameter values to calculate a third shape parameter value of a third shape parameter of the drop.
- Country/Region
- USA
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