AsiaIPEX is a one-stop-shop for players in the IP industry, facilitating IP trade and connection to the IP world. Whether you are a patent owner interested in selling your IP, or a manufacturer looking to buy technologies to upgrade your operation, you will find the portal a useful resource.
Improved Dimensional Measurement through Combined Optical Scattering and Photogrammetry
Detailed Technology Description
Patent No.: 9,151,607This invention relates to a system and method for determining the location and orientation of an object using both optical scattering and photogrammetry.
Country/Region
USA
For more information, please click Here
