2-Photon Shack-Hartmann Wavefront Sensor
- Detailed Technology Description
- We provide a cost-effective method for doublingthe working spectrum range of a conventional single-photon Shack Hartmann WavefrontSensor (1P-SHWS) through conversion into a two-photon Shack Hartmann Wavefront Sensor(2P-SHWS).
- Others
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Publications
- Fei Xia, David Sinefeld, Bo Li, and Chris Xu,"Two-photon Shack–Hartmann wavefront sensor," Opt. Lett. 42,1141-1144 (2017). https://doi.org/10.1364/OL.42.001141
- *Abstract
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Technology Overview Our technology doublesthe working spectrum of conventional wavefront sensors. Conventional Si-based single-photon detectorshave a cutoff at about 1127nm for single-photon measurements; we were able toperform two-photon wavefront measurements at wavelengths up to 2200nm (See Below).
This method allows Si-baseddetectors to be performance and price-competitive with phosphorous or InGaAsdetectors which are cost prohibitive for most applications. Our design parameters can be applied to systems basedon NIR or mid-IR laser. Improvements in detection sensitivity of up to 350x canbe realized without additional calibration of the wavefront sensor or modification to image
processing.
Potential Applications
- Wavefront sensing through highly scattered medium includingbiological sample
- Laser scanning microscopy
- Aberration correction in adaptive optics systems for:
- Optical Communications
- Medical and Retinal Imaging
- Optical Coherence Tomography
Advantages
- Two-fold Expansion of spectrum range for wavefront sensors
- Significant cost savings compared to custom phosphorus orInGaAs sensors
Keywords: Physical Sciences, Engineering, Physics, Nanotechnology, Nanoapplications, Optics & Photonics, Device Manufacturing, Lasers, LEDs, Measurement, Microscopy, Photonics, Visual Enhancements, Computer Hardware, Input devices, Image Processing
- *Licensing
- Patrick Govangpjg26@cornell.edu1-607-254-2330
- Country/Region
- USA
