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Novel Quantum Dot Field-Effect Transistors Free of the Bias-Stress Effect


Detailed Technology Description

When a quantum dot (QD) field-effect transistor (FET) is turned on in n-channel or p-channel mode, the established drain-source current rapidly decreases from its initial magnitude in a stretched exponential decay, resulting in the bias-stress effect. This instability associated with bias-stress precludes technological applications of QD FETs, e.g., in flexible displays or chemical sensing. Researchers at the University of California, Irvine have developed novel QD FETs that eliminate this instability thus allowing the use of QD FETs in displays for TVs, tablet, phones, and more.


Application No.

20160181407


Others

Tech ID/UC Case

24860/2015-323-0


Related Cases

2015-323-0


Country/Region

USA

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