Microwave and Millimeter Wave Probe for Non-destructive Material Characterization
- IP Title
- Microwave and Millimeter Wave Probe for Non-destructive Material Characterization
- Detailed Technology Description
- None
- Application Date
- Sep 13, 2013
- Application No.
- 9,482,626
- Others
-
- *Abstract
-
An open-ended waveguide probe including a finite flange extending outwardly and functioning as an infinite flange. A signal source provides a microwave signal to the waveguide, which in turn transmits microwave electromagnetic energy incident upon an object to be tested. The finite flange at the waveguide aperture is shaped to reduce scattering of the electromagnetic field reflected from the object and received by the aperture. The probe is adapted for coupling to a receiver for sampling the reflected electromagnetic field received by the aperture and the receiver is adapted for coupling to a processor for determining at least one material characteristic of the object based on sampled electromagnetic field reflected from the object.
- *IP Issue Date
- Nov 1, 2016
- *Principal Investigator
-
Name: Reza Zoughi, Professor
Department:
Name: Mohammad Ghasr, Graduate Student - PhD
Department:
Name: Matthew Kempin
Department:
- Country/Region
- USA
For more information, please click Here
