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Microwave Guided Wave Attenuation Measurement of Thin Coatings

Detailed Technology Description

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*Abstract

Microwave nondestructive testing techniques, employing open-ended rectangular waveguide probes, have shown tremendous potential for evaluating dielectric and magnetic properties and thickness layered non-conducting composite materials, such as radomes, coatings, slabs, etc. However, these techniques provide localized information about the properties of the composite material under test. It is desirable to develop a methodology that is capable of measuring material properties of coating and layered composites over a relatively long distance (i.e., tens of centimeters) on the structure under test. This is possible through creating a testing method where the interrogating microwave signal is guided through the coating over the distance of interest. For coatings on top of conducting substrates this is accomplished by modifying the waveguide measurement technique to intentionally create a guided wave between the conducting substrate and an extended waveguide flange. This unique technique also provides for measurements over a relatively wide range of microwave frequencies using one probe, and is also expandable to evaluating the dielectric, magnetic and geometrical (i.e., thickness) properties of several layers from a single wideband measurement. This presentation outlines the fundamental idea behind this method as well as the results of simulations sowing the potential efficacy of this unique evaluation technique.

*Principal Investigator

Name: Reza Zoughi, Professor

Department:

Name: Mohammad Ghasr, Graduate Student - PhD

Department:

Country/Region

USA