Measuring device and measuring method that use pulsed electromagnetic wave
- Detailed Technology Description
- None
- Countries
- United States
- Application No.
- US8710440B2
- *Abstract
-
Provided are a measuring device and a measuring methodthat use terahertz light, by which a substance to be detected can be detectedwith high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substancedetection plate, a means for generating the pulsedelectromagnetic wave having amplitude intensity dependent onthe amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsedlaser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the changeof the state of a solution containing the substance to be detected on the basis of the amplitude intensity. Saidmeasuring device is provided with a first beam splitter whichdivides the pulse laser beam into two, a detection region part into which the solutioncontaining the substance to be detected can be introduced, and a reference region part into which a referencesolution can be introduced, irradiates a semiconductorcorresponding to the detection region part anda semiconductor corresponding to the reference region respectively with the twodivided pulsed laser beams, collects pulsed electromagneticwaves generated from the semiconductors corresponding to the detection regionpart and the referenceregion part, and detects the collected pulsed electromagnetic waves by said ondetection means.
- *IP Issue Date
- None
- *IP Type
- Utility
- Country/Region
- USA
