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Z-Microscopy

Technology Benefits

ΓÇó Improves z-direction imaging speed while maintaining sectioning capabilityΓÇó Utilizes an array of micro-mirrorsΓÇó Image signals emitted from different axial positions ΓÇó Can reach nearly diffracted limited axial resolution

Detailed Technology Description

Background:Laser scanning optical microscopy has become a widely used imaging technique due to its unique optical sectioning capability. In conventional optical microscopy, there is a disparity in the lateral (x-y directions) and axial (z direction) imaging speed. An image in the x-y plane can be routinely acquired at high speed, however slow mechanical scanning of the objective lens hinders the z-direction for axial imaging. Other microscopy techniques have been proposed to improve imaging speed in the axial direction, such as multi-focal and holography, but these techniques lack optical sectioning capability. Invention Description:The proposed method for parallel axial imaging, or z-microscopy, utilizes an array of tilted micro-mirrors arranged along an axial direction of a probe. Typically the micro-mirrors are placed at 45┬░ angles with respect to the axial direction. These image signals emitted from different axial positions can be reflected by corresponding micro-mirrors and spatially separated for parallel detection, essentially converting the more challenging axial imaging to a lateral imaging problem. Numerical studies have shown that nearly diffracted limited axial resolution can be obtained by z-microscopy.

*Abstract

The proposed method for parallel axial imaging, or z-microscopy, utilizes an array of tilted micro-mirrors arranged along an axial direction of a probe.

*Principal Investigator

Name: Zhiwen Liu, Dr

Department: Electrical Engineering

Country/Region

USA