New Resins for Serial Block-Face Scanning Electron Microscopy
- Detailed Technology Description
- University researchers have developed new resins to immobilize tissue samples in Serial Block-face Scanning Electron Microscopy (SBFSEM). The invention has been demonstrated to lead to dramatic improvements in image contrast and resolution for SBFSEM.
- Application No.
- 20160163505
- Others
-
Tech ID/UC Case
24220/2014-007-0
Related Cases
2014-007-0
- *Abstract
-
The advent of serial block-face scanning electron microscopy (SBFSEM) promises to revolutionize histology and neuroanatomical research by allowing the 3-dimensional reconstruction of relatively large regions of tissue and cell arrays at near nanometer-scale resolution. In SBFSEM, successive slices are removed from the targeted tissue and an electron beam is scanned over the remaining block-face to produce electron backscatter images. A principal limitation of this approach is that the resolution obtainable using backscatter electron imaging at low accelerating voltage is modest compared to traditional transmission electron microscopy.
- *IP Issue Date
- Jun 9, 2016
- *Principal Investigator
-
Name: James Bouwer
Department:
Name: Eric Bushong
Department:
Name: Thomas Deerinck
Department:
Name: Mark Ellisman
Department:
Name: Donald Johnson
Department:
Name: Ranjan Ramachandra
Department:
Name: Jay Siegel
Department:
- Country/Region
- USA

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