AsiaIPEX is a one-stop-shop for players in the IP industry, facilitating IP trade and connection to the IP world. Whether you are a patent owner interested in selling your IP, or a manufacturer looking to buy technologies to upgrade your operation, you will find the portal a useful resource.

Back to search results

Atomic Force Photovoltaic Microscopy

Technology Benefits

Unlike techniques that characterize only photovoltaic films, AFPM examines functioning photovoltaic devices, providing standard figures of merit such as power conversion efficiency. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of opto-electronic materials and devices.

Detailed Technology Description

An atomic force photovoltaic microscope (AFPM) has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. A biased conductive atomic force microscopy (cAFM) probe is raster-scanned over an array of illuminated solar cells enabling the determination of short-circuit current Isc, open-circuit voltage Voc, fill factor and power conversion efficiency ηp of functioning photovoltaic devices.

Country/Region

USA

For more information, please click Here