Atomic Force Photovoltaic Microscopy
Unlike techniques that characterize only photovoltaic films, AFPM examines functioning photovoltaic devices, providing standard figures of merit such as power conversion efficiency. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of opto-electronic materials and devices.
An atomic force photovoltaic microscope (AFPM) has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. A biased conductive atomic force microscopy (cAFM) probe is raster-scanned over an array of illuminated solar cells enabling the determination of short-circuit current Isc, open-circuit voltage Voc, fill factor and power conversion efficiency ηp of functioning photovoltaic devices.
美國
