- Contact-free so the circuit-under-test is never damaged by the probe.- Antenna-free so the devices under test need no special design or fabrication.- Increased coupling with increasing frequency (particularly above 500 GHz), unlike the coupling in metal-to-metal contact probes.
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The method:ΓÇóSaves a significant amount of time and money to label new data pointsΓÇóDetermines the level of expertise/appropriateness of labelers for new data pointsΓÇóBuilds a mathematical/probabilistic model to predict the label of a data pointΓÇóCan be implemented as software embedded onto a pr.....
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