Researchers from the University of Illinois have developed a new way to use surface plasm on resonance that allows for quantitative analysis using colorimetric techniques.
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- Contact-free so the circuit-under-test is never damaged by the probe.- Antenna-free so the devices under test need no special design or fabrication.- Increased coupling with increasing frequency (particularly above 500 GHz), unlike the coupling in metal-to-metal contact probes.
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