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phase-kick Electrostatic Force Microscopy (pk-EFM): Atomic Force Microscopy method for probing solar cell materials

Detailed Technology Description

Our new method, phase-kickElectrostatic Force Microscopy (pk-EFM), significantly improves the timeresolution of electric force microscopy (EFM), enabling the rapid acquisitionof photocapacitance transients in solar cell films.

Others

Publications

Ryan P. Dwyer, Sarah R. Nathan, John A. Marohn. “Microsecond photocapacitance transientsobserved using a charged microcantilever as a gated mechanical integrator”;Science Advances, 09 Jun 2017: Vol.3, no. 6. DOI:10.1126/sciadv.1602951
“Group's measuringtool probes solar-cell materials” CornellChronicle, June 2017. http://news.cornell.edu/stories/2017/06/groups-measuring-tool-probes-solar-cell-materials

Country/Region

USA

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