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A Noninvasive Method for Measuring the Thickness of a Dynamic Liquid Film

Summary

Researchers at Purdue University have developed a noninvasive method for measuring the thickness of thin dynamic liquid film, Partial Coherent Interferometry. Unlike its predecessors, measurement results are not affected by laser attenuation or reflection and are accurate within a few micrometers. This noninvasive method can measure a variety of dynamic processes. This method provides accurate measurements in multiple applications including atomizers used for propulsion, energy production, and other chemical engineering applications. Characterizing sheet thickness is important for understanding the underlying physics.

Technology Benefits

Accurately measures dynamic processes Noninvasive Less limitations Measurement results not affected by laser attenuation and reflection

Technology Application

Aerospace Atomizers used in propulsion Energy production Chemical engineering

Detailed Technology Description

Jun ChenJun Chen ResearchPurdue Fluid Mechanics and Propulsion ResearchPurdue Mechanical Engineering

Countries

United States

Application No.

None

Country/Region

USA

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