Media.Player

(ORTHOGONAL MODE WAVEGUIDE PROBE) APPARATUS AND METHOD FOR NONDESTRUCTIVE TESTING AND EVALUATION OF COMPLEX COMPOSITE STRUCTURES INCLUDING AN ORTHOGONAL MODE WAVEGUIDE PROBE

IP Title

Non-Destructive Testing of Physical Characteristics of Composite Structures

Detailed Technology Description

None

Supplementary Information

Inventor: Zoughi, Reza | Kharkivskiy, Sergiy | Stephen, Vivian
Priority Number: US7439749B2
IPC Current: G01R002704 | G01R002732
US Class: 324637 | 324644
Assignee Applicant: The Curators of the University of Missouri,Rolla
Title: Non-destructive testing of physical characteristics of composite structures
Usefulness: Non-destructive testing of physical characteristics of composite structures
Summary: Method of detecting anomaly in composite material such as carbon fiber reinforced polymer (CFRP) material (claimed) adhered to concrete substrate.
Novelty: Method of detecting anomaly in composite material e.g. carbon fiber reinforced polymer material, involves issuing information about composite material based on compensated voltage signal generated by compensator circuit

Industry

Electronics

Sub Category

Circuit Design

Application Date

Oct 23, 2006

Application No.

7,439,749

Others

*Abstract

Non-confidential Abstract of Invention: An apparatus and method for microwave and millimeter wave nondestructive testing and evaluation of complex composite structures using an open-ended orthogonal mode waveguide probe possessing two orthogonal polarization modes are disclosed. Two microwave or millimeter wave signals are transmitted to the orthogonal mode waveguide probe with at least two ports, transmitting two linear orthogonal polarized transmitted signals to the structure under inspection (SUI) and receiving two linear and orthogonal polarized reflected signals. The two linear and orthogonal polarized reflected signals both vary as a function of standoff distance, which is defined as the distance between the SUI and the probe aperture. The reflected signals are transmitted to two detectors providing two DC output voltages. Subsequently, these voltages are applied to a compensator circuit the output of which is a DC voltage proportional to the internal structures of the SUI and its defects and not the standoff distance or surface roughness variations. Appropriate means is used to provide separate information from each port for non-contact sensing standoff distance variation. The proper arrangement of the orthogonal mode waveguide probe and the SUI, and the proper use of the compensator circuit provides for increased sensitivity of the inspection technique and its probability of detection and evaluation of many different types of defects in variety of complex structures, reducing the time required for data acquisition due to an automatic removal of undesired variations.

*IP Issue Date

Oct 21, 2008

*Principal Investigator

Name: Reza Zoughi, Professor

Department:

Name: Vivan Stephen

Department:

Name: Sergiy Kharkivskiy, Res. Assoc Professor

Department:

Country/Region

USA