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Bridge Enhanced Nanoscale Impedance Microscopy
Technology Benefits
· Greater spatial resolution · Greater sensitivity
Detailed Technology Description
A conductive atomic force microscopy (cAFM) adjunct has been developed by Northwestern scientists that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivity. Significant improvement in sensitivity and spatial resolution will enable the study of electronic behavior in nanomaterials and biological samples. #instrumentation #atomicprobemicroscopy
Country/Region
USA
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