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Atomic Force Electroluminescence Microscopy

Technology Benefits

The AFEM provides advances in operation, light sensitivity, resolution, current input and emission spectroscopy measurement versus other device characterization techniques. AFEM can concurrently monitor device topography, charge transport, and electroluminescence with nanometer spatial resolution.

Detailed Technology Description

Northwestern University scientists have invented a new atomic force microscope tool, AFEM, capable of gathering simultaneous topographical, current, and electroluminescence information through a commercially available conductive AFM tip. Characterization of individual bottom-emitting opto-electronic devices, such as light-emitting diodes and electroluminescent devices at 10 nm resolution potential is offered.#materials #manufacturing #instrumentation #atomicprobemicroscopy

Country/Region

USA

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