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Evanescent Microwave Microscopy Probe

Technology Benefits

- Pure evanescent wave, resulting in minimal sample heating- High resolution (1 micron)- High sensitivity (quality factor Q > 500K)

Technology Application

- Material characterization: organic/inorganic, biological, and superconductor- Thin film measurements: dielectric, metamaterial, and nanostructured- Detection of anomalies under the surface, such as corrosions and inclusions

Detailed Technology Description

None

Supplementary Information

Inventor: Kleismit, Richard A. | Kozlowski, Gregory
Priority Number: US7501833B2
IPC Current: G01R002704 | G01R002732
US Class: 324637 | 324633
Assignee Applicant: Wright State University,Dayton
Title: Evanescent microwave microscopy probe and methodology
Usefulness: Evanescent microwave microscopy probe and methodology
Summary: Used for imaging evanescent microwave fields and samples, and for microwave microscope that is utilized for measuring material parameter such as permittivity, permeability, electrical conductivity and local electromagnetic properties of material such as conductor, dielectric and superconductor.
Novelty: Evanescent microwave microscopy probe for e.g. microwave microscope, has tuning network in electronic communication with center conductor and outer shield, and including pair of sapphire capacitors connected in parallel

Industry

Measurement/Testing

Sub Group

Measurement Tool

Country/Region

USA

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