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Aging Monitoring for Power Semiconduct Devices Using Case Temperatures

Detailed Technology Description: A new method for using two dimensional case temperature-based aging monitoring for insulated-gate bipolar transistor (IGBT) modules in power converters.

*Abstract: None

*Licensing: Zane Gernhart, Ph.D.Technology Manager zgernhart@nutechventures.orgPhone: 515-408-4685

Country/Region: USA

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