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相位調製陣列微型光譜儀光譜復原方法

Summary
本發明是一種相位調製陣列微型光譜儀光譜復原方法，該方法爲：1) 對入射光進行光學整形，2) 對CCD 所得數據進行修正，3) 根據CCD 的頻率探測範圍[f ,f ] 以及微型干涉儀的數量n ，將該頻段分成n 等份，4) 根據事先測得的各個頻率的光a b通過各個微型干涉儀的透射率，以及各CCD實際所測值，組成一個綫性方程組； 5) 該綫性方程組用Tikhonov 正則化方法求解；6) 光譜輻射定標，得到入射光的光譜；7) 如果需要較高的光譜頻率分辨率，需要再次進行光譜復原。本方法解决了背景技術中入射光不均勻，測量頻率範圍寬的同時如何保證分辨率高且沒有明顯失真等技術問題。

Application No.
09/ENG/344
Others
Inventor(s): Professor HO Ho Pui Aaron, Department of Electronic Engineering Patent Status: Chinese Patent Pending Licensing Status: Available for licensing

Country/Region
Hong Kong

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