Search
  • 網站搜尋
亞洲知識產權資訊網為知識產權業界提供一個一站式網上交易平台,協助業界發掘知識產權貿易商機,並與環球知識產權業界建立聯繫。無論你是知識產權擁有者正在出售您的知識產權,或是製造商需要購買技術以提高操作效能,又或是知識產權配套服務供應商,你將會從本網站發掘到有用的知識產權貿易資訊。
返回搜索結果

Selective Plane Illumination for throughput three-dimensional time course imaging


技術優勢

§ Easily applied to the conventional inverted microscope; older systems can be simply upgraded. § Broad range of samples can now be imaged; different nature, thicknesses and sealing type. § Use of high Numerical Aperture (NA) lenses is facilitated, which enhances the imaging sensitivity (down to single molecule) § Isolation of optics and samples is achieved, allowing imaging of sealed sample containers if needed § The new sample chamber facilitates the observation of multiple-wells simultaneously, in an automated, accurate and fast manner, which leverages the throughput of the device significantly. § All microscope ports remain available for other purposes § Field of view is maximized


詳細技術說明

Selective Plane Illumination Microscopy (SPIM) proves to be a conventional and reliable candidate for fast three-dimensional imaging, with potential for high resolution imaging of cells and tissues. One of the key features for this technology is highly efficient image recording, significant depth penetration and reduced photo-bleaching. SPIM mainly utilizes two lenses; one for illumination and another for detection. Current SPIM arrangements require specific sample preparations, which unfortunately exclude the use of conventional sample mounts, such as coverslips, culture dishes and multi-well plates. In spite of the great potential that the SPIM technology can offer, currently followed approaches suffer from major drawbacks that need to be addressed. One popular approach is dipping the lens in the sample container so that they are both in the same fluid, while the other approach uses a light sheet generated by reflecting a beam incident from top using a small mirror. Dipping the lens in the sample container not only increases the container’s size, but also eliminates the isolation between the optics and samples. Moreover, dipping from the top limits access from that direction. On the other hand, using the mirror imposes a need for precise positioning close to the sample, as well as risking mirror degradation because of the chemicals in the immersion fluid used. Such drawbacks impose major restrictions on the use of the SPIM technology, limiting the capabilities and potential that such technology has to offer. Researchers at UCI devised an innovative method for high-throughput 3D imaging that addresses the drawbacks of conventional techniques. Their method includes a novel illumination technique, as well as a modified sample chamber design. Such modifications maximize the field of view, eliminate the need for dipping the lens in the sample container and provide appropriate isolation. Moreover, such new arrangement facilitates the use of a wider range of samples varying in nature, thickness and sealing. The modified camber design enables multi-well monitoring, in an automated manner that would yield an unprecedented throughput imaging solution. The devised method unleashes the capabilities and opportunities offered by SPIM technology, which would improve the imaging process features and ability to track samples’ development with time in an accurate and fast manner.


其他

State Of Development

· Built and tested a prototype

· Verified that optical aberrations are minimal after introduction of the resin to match the refractive index

· Demonstrated that the design is compatible with 2-photon excitation


Related Materials

Hedde PN, Malacrida L, Gratton E. Selective Plane Illumination Microscopy in the Conventional Inverted Microscope Geometry. Biophysical Journal. 2017 Feb 3;112(3):145a.
Hedde PN, Gratton E. Fluorescence Anisotropy Imaging in 3D with Single Plane Illumination Microscopy. Biophysical Journal. 2016 Feb 16;110(3):482a.
Hedde PN, Gratton E. Selective plane illumination microscopy with a light sheet of uniform thickness formed by an electrically tunable lens. Microscopy research and technique. 2016 Jun 1.


Tech ID/UC Case

28785/2017-198-0


Related Cases

2017-198-0


國家/地區

美國

欲了解更多信息,請點擊 這裡
Business of IP Asia Forum
桌面版