Device and Method for Measuring Beam Quality in CT
Allows HVL measurements to be preformed with one rotation of the CT scannerEnables rapid and reliable characterization of the x-ray beam that is used in CT scannersAdapts easily to stationary X-ray sources (e.g. fluoroscopy, radiography and mammography) to obtain HVL measurements
Measurement of X-ray beam quality in CT scanners and in projection radiography settings (including fluoroscopy, radiography and mammography) and enable rapid and reliable characterization of the x-ray beam.
For medical imaging applications which use X-rays, part of the necessary characterization of the X-ray beam "quality" required the measurement of the half value layer (HVL), which is the thickness, typically in aluminum, which reduces the X-ray intensity of the X-ray beam by 50%. The HVL is routinely measured in projection X-ray imaging situations such as in mammography, radiography, and fluoroscopy. However, for computed tomography (CT), the X-ray source rotates around the gantry and this precludes the measurement of HVL using the standard set-up of an exposure meter with aluminum filters. Researchers at the University of California, Davis have developed a device and methods for measuring HVL in a CT machine while the X-ray tube is rotating. Therefore, the CT gantry does not need to be placed in a parked position, and a service engineer is not required to help in the measurements. This invention, therefore, makes the measurement of the HVL in CT practical, automated, accurate, and fast. Our researchers have prototyped a case device to be used with a real-time dosimeter; accompanying method packages for estimation of the HVL from the real-time doe measurements have also been developed.
Patent Number: US20130016808A1
Application Number: US13550502A
Inventor: Boone, John M. | Burkett, JR., George W. | McKenney, Sarah E.
Priority Date: 15 Jul 2011
Priority Number: US20130016808A1
Application Date: 16 Jul 2012
Publication Date: 17 Jan 2013
IPC Current: G01N002306 | G01N002300
US Class: 378051 | 378207 | 378208
Assignee Applicant: The Regents of the University of California
Title: APPARATUS AND METHODS FOR DETERMINATION OF THE HALF VALUE LAYER OF X-RAY BEAMS
Usefulness: APPARATUS AND METHODS FOR DETERMINATION OF THE HALF VALUE LAYER OF X-RAY BEAMS
Summary: Apparatus for imaging measurement of a HVL cage structure of an imaging system. Uses include but are not limited to fluoroscopy based imaging system, radiography based imaging system, mammography based imaging system, computed tomography based imaging system and x-ray based imaging system.
Novelty: Apparatus for imaging measurement of half-value level cage structure of e.g. imaging system, has cage structure including central opening defined by filter, where filter includes thickness that varies peripherally around central axis
生物醫學
醫學影像
9008264
Additional Technologies by these Inventors Tech ID/UC Case 22455/2010-719-0 Related Cases 2010-719-0
美國
