亞洲知識產權資訊網為知識產權業界提供一個一站式網上交易平台，協助業界發掘知識產權貿易商機，並與環球知識產權業界建立聯繫。無論你是知識產權擁有者正在出售您的知識產權，或是製造商需要購買技術以提高操作效能，又或是知識產權配套服務供應商，你將會從本網站發掘到有用的知識產權貿易資訊。

返回搜索結果

Bridge Enhanced Nanoscale Impedance Microscopy

技術優勢

· Greater spatial resolution · Greater sensitivity

詳細技術說明

A conductive atomic force microscopy (cAFM) adjunct has been developed by Northwestern scientists that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivity. Significant improvement in sensitivity and spatial resolution will enable the study of electronic behavior in nanomaterials and biological samples. #instrumentation #atomicprobemicroscopy

國家/地區

美國

欲了解更多信息，請點擊這裡