High-Speed Plasmonic Structured Illumination Microscopy
UC San Diego researchers have developed a method and apparatus to perform fast, nanoscale optical microscopy using structured illumination provided by tunable plasmon interference patterns. The invention is referred to as plasmonic structured illumination microscopy (PSIM). Surface plasmons—electromagnetic waves formed by collective oscillations of electrons at a metal/dielectric interface—propagate such that their wavelength is shorter than that of light of the same frequency. Hence, plasmons enable illumination patterns with spatial resolution superior to that attainable by direct use of light and standard optics. In the invention, multiple measurements are obtained with different phase-shifts between the object and plasmonic illumination pattern, which are needed for high-resolution image reconstruction. Phase tuning is implemented using a fast, programmable space light modulator, thus making high-speed data acquisition and dynamic imaging studies possible. PSIM can achieve at least 3- to 5-fold spatial resolution improvement compared with conventional optical microscopy and imaging speeds of ≥ 50 frames/second. It can be implemented for both scattering and fluorescence microscopy, including non-linear SIM, and promises to be a breakthrough tool for studies requiring sub-diffraction-limited resolution and ultra-fast dynamic imaging (e.g., Brownian motion, neurotransmitter imaging).
Patent Number: US20120069344A1
Application Number: US13146550A
Inventor: Liu, Zhaowei
Priority Date: 29 Jan 2009
Priority Number: US20120069344A1
Application Date: 29 Nov 2011
Publication Date: 22 Mar 2012
IPC Current: G01B000902
US Class: 356450
Assignee Applicant: The Regents of the University of California
Title: HIGH RESOLUTION STRUCTURED ILLUMINATION MICROSCOPY
Usefulness: HIGH RESOLUTION STRUCTURED ILLUMINATION MICROSCOPY
Summary: High-resolution optical microscopy method for both scattering and fluorescence microscopy.
Novelty: High-resolution optical microscopy method for both scattering and fluorescence microscopy involves capturing respective images of specimen resulting from generated different surface plasmon interference patterns
生物医学
医学影像
8836948
State Of Development This invention has a patent pending and is available for sponsored research and/or licensing. Tech ID/UC Case 19382/2009-202-0 Related Cases 2009-202-0
美国
