AN AUTOMATIC CAP ARRANGEMENT SCORING DEVICE
DEVICE AND METHOD FOR DETERMINING A CAP ARRANGEMENT INDICATING COLOR DISCRIMINATION
None
Inventor: AbouKhousa, Mohamed Ahmed | Zoughi, Reza | Kharkivskiy, Sergiy
Priority Number: US8212573B2
IPC Current: G01R002704
US Class: 324637
Assignee Applicant: The Curators of the University of Missourilumbia
Title: High frequency analysis of a device under test
Usefulness: High frequency analysis of a device under test
Summary: Method for analyzing device under test (DUT) such as radar antenna. Can also be used in high frequency circuit components, imaging system, high frequency transceiver and ranging system.
Novelty: Method for analyzing device under test (DUT) e.g. radar antenna, involves determining characteristic representative of DUT as a function of magnitude of standing wave sampled at several phase shifts
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Nov 24, 2009
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