Aging Monitoring for Power Semiconduct Devices Using Case Temperatures
- 詳細技術說明
- A new method for using two dimensional case temperature-based aging monitoring for insulated-gate bipolar transistor (IGBT) modules in power converters.
- *Abstract
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None
- *Licensing
- Zane Gernhart, Ph.D.Technology Manager zgernhart@nutechventures.orgPhone: 515-408-4685
- 國家/地區
- 美國
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