A Machine Learning Approach to Run-by-Run Control using Wavelet Modulated Sensor Data
- 詳細技術說明
- USF inventors have proposed a controller that is capable of generating optimalcontrol actions in the presence of multiple time-frequencydisturbances and allows the use of realistic (often complex) processmodels without sacrificing robustness and speed of execution.
- *Abstract
-
Researchers at the University of South Florida have developed
a new method of performing wavelet-modulated
reinforcement learning-based run-by-run (RbR) control to
manage output variability in a manufacturing process run.
- 國家/地區
- 美國
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