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AN AUTOMATIC CAP ARRANGEMENT SCORING DEVICE

標題

DEVICE AND METHOD FOR DETERMINING A CAP ARRANGEMENT INDICATING COLOR DISCRIMINATION

詳細技術說明

None

*Abstract

AUTOMATIC CAP ARRANGEMENT SCORING DEVICEPoor color vision can be inherited (an estimated 8% of men and .5% of women have a congenital color vision defect) or acquired as the result of disease, certain medications, trauma, aging, or exposure to particular chemicals and other environmental factors. Cap arrangement tests (e.g. Farnsworth-Munsell 100 Hue, Farnsworth D-15, L’Anthony D-15 Desaturated, etc.) are among the most valid and reliable color vision tests to quantify color deficits currently available. However, these tests, particularly the FM 100, are time consuming to score and are highly susceptible to transcription errors.Researchers at the University of Missouri-St. Louis have developed the Automatic Cap Arrangement Scoring Device (ACASD) to significantly reduce testing time and improve measurement reliability of cap arrangement tests by electronically automating scoring and data entry. Once the patient places the caps in the test tray, the rest will be automatic -- scoring, data entry and printing of results. Upgrading existing cap arrangement devices is easy by transferring existing test papers to the new cap.POTENTIAL APPLICATIONS--Standard cap arrangement color vision tests given not only by optometrists and ophthalmologists as part of a visual examination, but employers filling positions with color vision requirements --Other applications where specific sequences of small items are necessary BENEFITS--Fully automates the previously manual scoring and data input of cap arrangement color deficiency tests, significantly reducing testing time, effort and potential errors--Existing cap arrangement devices can be inexpensively upgraded by transferring the test papers to the new test caps, increasing market size and profit potential --Fast and reliable color vision testing, enhancing user acceptance by eye care professionals and employers who require such testing for color-sensitive jobs (law enforcement, fire fighters, scientists, electricians, pilots and others)--Inexpensive to manufacture, offering potential for high profit marginsDEVELOPMENT STATUS: A prototype has been developedIP STATUS: U.S. Patent Application published 5/20/2010 (No. US-2010-0125221)REFERENCE NO.: #05UMS051CONTACTTamara WilgersDirector, Technology Commercialization & Economic DevelopmentUniversity of Missouri-St. Louis314-516-6884wilgerst@umsl.edu

*IP Issue Date

Feb 19, 2013

*IP Publication Date

May 20, 2010

*Principal Investigation

Name: Carl Bassi, Associate Professor

Department:

Name: Michael Howe

Department:

Name: Wayne Garver, Research Scientist

Department:

附加資料

Inventor: AbouKhousa, Mohamed Ahmed | Zoughi, Reza | Kharkivskiy, Sergiy
Priority Number: US8212573B2
IPC Current: G01R002704
US Class: 324637
Assignee Applicant: The Curators of the University of Missourilumbia
Title: High frequency analysis of a device under test
Usefulness: High frequency analysis of a device under test
Summary: Method for analyzing device under test (DUT) such as radar antenna. Can also be used in high frequency circuit components, imaging system, high frequency transceiver and ranging system.
Novelty: Method for analyzing device under test (DUT) e.g. radar antenna, involves determining characteristic representative of DUT as a function of magnitude of standing wave sampled at several phase shifts

主要類別

電子

細分類別

電路設計

申請日期

Nov 24, 2009

申請號碼

8,376,956

其他

國家/地區

美國