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Evanescent Microwave Microscopy Probe

技術優勢

- Pure evanescent wave, resulting in minimal sample heating- High resolution (1 micron)- High sensitivity (quality factor Q > 500K)

技術應用

- Material characterization: organic/inorganic, biological, and superconductor- Thin film measurements: dielectric, metamaterial, and nanostructured- Detection of anomalies under the surface, such as corrosions and inclusions

詳細技術說明

None

*Abstract

The inventors created an evanescent microwave microscopy probe for near field microscopy. To study a material, two measurements are taken, one near the surface, and one on the surface of the sample. The materialΓÇÖs characteristic, represented by complex permittivity is then calculated. The probe comprises a low loss, apertured, coaxial resonator that can be tuned over a large bandwidth. A chemically sharpened probe tip extends slightly past the end aperture of the probe and emits a purely evanescent field.

*Principal Investigation

Name: Gregory Kozlowski

Department:

Name: Richard Kleismit

Department:

附加資料

Inventor: Kleismit, Richard A. | Kozlowski, Gregory
Priority Number: US7501833B2
IPC Current: G01R002704 | G01R002732
US Class: 324637 | 324633
Assignee Applicant: Wright State University,Dayton
Title: Evanescent microwave microscopy probe and methodology
Usefulness: Evanescent microwave microscopy probe and methodology
Summary: Used for imaging evanescent microwave fields and samples, and for microwave microscope that is utilized for measuring material parameter such as permittivity, permeability, electrical conductivity and local electromagnetic properties of material such as conductor, dielectric and superconductor.
Novelty: Evanescent microwave microscopy probe for e.g. microwave microscope, has tuning network in electronic communication with center conductor and outer shield, and including pair of sapphire capacitors connected in parallel

主要類別

測量/測試

細分類別

測量工具

國家/地區

美國