Spectral Imaging for Vertical Sectioning of Surface Bound Markers
- 詳細技術說明
- None
- *Abstract
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The invention is a new technique in fluorescent imaging. The technique utilizes the spectral oscillations emitted by a fluorophore located a distance of several wavelengths above a reflecting surface. These spectral oscillations are due to the self-interference from the direct and reflected emitted light, analysis of which yields the vertical position of the fluorophore to within a few nanometers corresponding to a resolution that is orders of magnitude better than confocal, two-photon, or other competing microscopes.
- 國家/地區
- 美國
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