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Non-Contact Measurement of Material Property

總結

A process for measuring a property of a sample is provided. The sample has an external surface enclosing an inner portion, and firstly, the sample is deformed by applying a predetermined non-contact pressure to deform a portion of the sample. Then a signal, which is at least suitable for transmission over the air, is directed towards the deformed portion of the sample, and further propagates through the external surface and the inner portion of the sample. Then an echoed signal generated by the inner portion of the sample in response to the propagation of the signal is detected; wherein the echoed signal incorporates information relating to a deformation of the inner portion of the sample. The property of the sample is determined from the deformation of the inner portion of the sample.

附加資料

Patent Number: US7124636B2
Application Number: US2004954022A
Inventor: Zheng, Yongping | Lu, Minhua
Priority Date: 30 Sep 2004
Priority Number: US7124636B2
Application Date: 30 Sep 2004
Publication Date: 24 Oct 2006
IPC Current: G01N002900
US Class: 073649 | 073644 | 073807 | 644807
Assignee Applicant: The Hong Kong Polytechnic University
Title: Non-contact measurement of material property
Usefulness: Non-contact measurement of material property
Summary: Used for measuring a property such as a mechanical property e.g. elasticity and rigidity, of a sample e.g. biological tissue and engineering material.
Novelty: Sample`s e.g. biological tissue, property e.g. elasticity, measuring process, involves determining deformation of each inner part of sample and external surface under pressure, and determining property of sample from deformation

主要類別

測量/測試

細分類別

測量工具

申請號碼

US2004954022A

其他

ZHENG Yongping
LU Minhua

國家/地區

美國