A Machine Learning Approach to Run-by-Run Control using Wavelet Modulated Sensor Data
- 详细技术说明
- USF inventors have proposed a controller that is capable of generating optimalcontrol actions in the presence of multiple time-frequencydisturbances and allows the use of realistic (often complex) processmodels without sacrificing robustness and speed of execution.
- *Abstract
-
Researchers at the University of South Florida have developed
a new method of performing wavelet-modulated
reinforcement learning-based run-by-run (RbR) control to
manage output variability in a manufacturing process run.
- 国家/地区
- 美国
欲了解更多信息，请点击 这里
