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Stable Monolithic Interferometer for High Precision Calibration
IP Title
Stable Monolithic Interferometer For Wavelength Calibration
Detailed Technology Description
None
Supplementary Information
Inventor: Wan, Xiaoke | Ge, Jian
Priority Number: US8570524B2
IPC Current: G01B000902 | G01J000345
US Class: 356451
Assignee Applicant: University of Florida Research Foundation Inc.inesville
Title: Stable monolithic interferometer for wavelenghth calibration
Usefulness: Stable monolithic interferometer for wavelenghth calibration
Novelty: Wavelength calibration method of spectral instrument involves adjusting spectral instrument based on comparison of test data and reference data
Industry
Optics
Sub Group
Optical Element
Application Date
Aug 3, 2010
Application No.
8,570,524
Others
Country/Region
USA
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