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Shell-Activated Sintering of Core-Shell Particles

總結
Purdue University researchers have developed a new interconnect technology based on low temperature sintering, replacing traditional solder joints, as well as high Pb and silver solder alloys, used for high temperature attach of semiconductor die to substrate. This technology lowers the processing temperature, improves interconnect characteristics, and minimizes the tin "whiskers."
技術優勢
Improved interconnect characteristicsMinimizes tin "whiskers"
技術應用
MaterialsManufacturing
詳細技術說明
Carol HandwerkerDesign LabPurdue Materials Engineering
*Abstract

*Background
Although consumer electronics have transitioned almost entirely to lead (Pb)-free solder interconnects, the new Pb-free interconnects have lower performance characteristics and require higher processing temperatures compared to their Pb-containing predecessor. These new interconnects also have the propensity to form tin "whiskers" that increase the risk of short circuits.
*IP Issue Date
None
*IP Type
Divisional
*Stage of Development
Concept Developed
*Web Links
Purdue Office of Technology CommercializationPurdueInnovation and EntrepreneurshipCarol HandwerkerDesign LabPurdue Materials Engineering
國家
United States
申請號碼
None
國家/地區
美國

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