Quality Certification Method for Additive Manufacturing Processes (13097)
- *Abstract
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Features and Benefits
- Process record for every volume element of a 3-D part
- Data structure encodes layer thickness and build orientation3-D quality certificate (3DCQ) data analyzed using any 3-D rendering system
- Efficient storage of layerwise and continuous monitor data
- Reduces need for post-fabrication inspection
*This technology is available for licensing, further development, or industrial partnering
Technology
Traditional quality certification methods place a cost burden on additive manufacturing (AM) and discourage utilization of AM advantages for short-run and custom manufacturing. The quality of parts manufactured via AM and intended for use in critical applications, such as aerospace and medical systems, must be "certified" before they can be used. Thus, a need exists for an improved quality certification method for AM processes that takes advantage of the unique characteristics of layerwise AM processes. UofL researchers are developing a method that utilizes data from continuous process monitoring throughout an AM process. The collected data is indexed to a template to create a digital 3D Quality Certificate (3DQC) that can be delivered along with the manufactured part to assure the customer that process monitor values were within specification throughout the fabrication process.
Process monitors may provide data that measure slowly changing conditions (e.g., build surface temperature) within the machine or that measure local conditions (e.g., peak temperature during laser scanning) point-wise within a layer. Once indexing is complete, the 3DQC is stored and labeled as a record of the manufacturing process for a specific part. The data in the 3DQC can be displayed using any one of several 3D rendering systems for viewing and analyzing 3D data records.
Markets Addressed
This technology will accelerate acceptance of additive manufactured parts in aerospace, medical and other industries where part quality is critical, benefiting both system OEMs and their suppliers. Developers of advanced process monitoring technologies will benefit by storing and presenting data from multiple sensors in a way that is specific to the part geometry and build orientation.
Technology Status
- IP Status: Patent Pending
- Development Status: Computational methods and data structures under development using monitor data for polymer laser sintering and for metal selective melting using both laser and e-beam.
- 國家/地區
- 美國
