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A Test and Characterization Device for Obtaining the Mechanical Behavior of Nanoscale wires, fibers, tubes and rods.

詳細技術說明

Provides for manipulation of nanostructures, such as nanotubes and nanowires, inside an SEM by transporting the specimens to a test device for nano-mechanical characterization. In the test device

*Abstract

Provides for manipulation of nanostructures, such as nanotubes and nanowires, inside an SEM by transporting the specimens to a test device for nano-mechanical characterization. In the test device, measurement transducers are attached to AFM probes and the transducers can be utilized to apply forces to the nanostructure. Such application of force via the transducer provides for a direct and continuous method of determining properties of the nanostructure and may allow for more efficient and accurate testing along with continuous electronic monitoring of the nanomaterial during displacement.This is in contrast to traditional methods where the sample is stretched and broken to determine the final breaking tensile strength, for instance. These methods make use of compliant, spring type transducers that (i) require extensive calibration procedures that are often unreliable and lead to less accurate measurements for obtaining the nano-mechanical behavior of nano-structures, and (ii) provide nanomechanical behavior at a few DISCRETE points during stretching of the samples, i.e., at yield, breaking, and determining the final breaking tensile strength.The technology is embodied in patent application 12/303,506, which is published as US-2009-0194689 and entitled "Method and system for measuring properties of microstructures and nanostructures."

國家/地區

美國