Optical Gating Of Electron Pulses For Femtosecond And Attosecond Electron Microscopy And Diffraction Imaging Applications
Title: Optical Gating of Electron Pulses for Femtosecond and Attosecond Electron Microscopy Invention: This technology provides a novel twist on the conventional optical gating technique and results in electron pulses of less that 100 femtoseconds. This provides improved temporal resolution for imaging done by electron microscopy and diffraction imaging. Background: Traditional electron microscopes are limited in their temporal resolution. The current state of the art has only achieved 200 femtosecond electron pulse widths. Using faster optical pulses to gate the electron pulses has been limited by the limitations on the optical pulse widths to drive the gating. Applications:Electronics manufacturingMaterials scienceForensic scienceMolecular mechanisms of disease (efficacy of treatment, predisposition to disease, etc.)Observing individual viruses and macromolecular complexes Advantages:Improves temporal resolutionExplores the ultrafast dynamics of matterAddresses a very specific industry demand Licensing Manager:Amy PhillipsAmyP@tla.arizona.eduRefer to case number UA18-144
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