Media.Player

Vertical Gate-Depleted Single Electron Transistors

技术应用

ADVANTAGES: The new UC technology provides the following benefits: Easier to interconnect than present devices; Increased integration density and improved performance; Allows for gate-splitting architectures; Simplifies the fabrication process.

详细技术说明

Scientists at the University of California have developed a novel approach to fabricating these devices which greatly simplifies the process while allowing the gate to be split into multiple gates.

*Abstract

None

*IP Issue Date

Jun 16, 2009

*Principal Investigation

Name: Filipp Baron

Department:

Name: Kang Wang

Department:

Name: Yaohui Zhang

Department:

附加资料

Patent Number: US7547932B2
Application Number: US2002302635A
Inventor: Zhang, Yaohui | Baron, Filipp A. | Wang, Kang L.
Priority Date: 22 Nov 2002
Priority Number: US7547932B2
Application Date: 22 Nov 2002
Publication Date: 16 Jun 2009
IPC Current: H01L0027108 | H01L002976 | H01L0029812
US Class: 257281 | 257192 | 257263 | 257280 | 257623
Assignee Applicant: The Regents of the University of California
Title: Vertical gate-depleted single electron transistor
Usefulness: Vertical gate-depleted single electron transistor
Summary: In semiconductor industry for reducing the device sizes.
Novelty: Vertical gate-depleted single electron transistor device in semiconductors industry comprises a mesa and gate Schottky contacts on top of interleaved layers of basic material and tunneling barrier with the mesa having ohmic contact

主要类别

电子

细分类别

半导体

申请号码

7547932

其他

BACKGROUND

In current vertical gate-depleted single electron transistors, the mesa must be etched to the point just below the tunneling barrier. In addition, the gate Schottky contact must wrap the pillar containing the tunneling barriers. These requirements considerably complicate the processing of these devices.

Additional Technologies by these Inventors

• Relaxed SiGe Films by Surfactant Mediation
• Novel Telegraph Signal Microscope For Visualizing Single Atoms And Detecting Defects In Nanotechnology Devices
• Novel Nanomaterial-based Thermo-Photovoltaic Cells
• Graphene Flash Memory Device
• Vertical-Stacked-Array-Transistor (VSAT) for Nonvolatile Memory Devices
• Vsat Structure for Nonvolatile Memory Device
• Epitaxial Growth of Single Crystalline MgO on Germanium
• A Self-Organized Critical CMOS Circuit for Computation and Information Processing
• Anti-Ferromagnetic Magneto-Electric Spin-Orbit Read Logic
• Quasi Van Der Walls Epitaxy Of GaAs on Graphene
• Periodically Rippled Antenna
• Graphene-Polymer Nanocomposite Incorporating Chemically Doped Graphene-Polymer Heterostructure for Flexible and Transparent Conductive Films
• Fabrication Of 1D Sinusoidal Silicon Dioxide Substrate
• Strained Voltage-Controlled Magnetic Memory Elements and Devices

Tech ID/UC Case

10257/2002-421-0

Related Cases

2002-421-0

国家/地区

美国