亚洲知识产权资讯网为知识产权业界提供一个一站式网上交易平台，协助业界发掘知识产权贸易商机，并与环球知识产权业界建立联系。无论你是知识产权拥有者正在出售您的知识产权，或是制造商需要购买技术以提高操作效能，又或是知识产权配套服务供应商，你将会从本网站发掘到有用的知识产权贸易资讯。

返回搜索结果

Atom Probe Tomography Method and Algorithm

技术优势: - Eliminates the need to “choose” clustering parameters - Results are much more statistically reliable and more representative of actual data - User-selected parameters by statistical hypothesis test (by desired confidence level) - Add-on to current APT analysis packages

*Abstract: Most cluster analysis parameters in atom probe tomography (APT) are selected ad hoc. This can often lead to data misinterpretation and misleading results by instrument technicians and researchers. Moreover, arbitrary cluster parameters can have suboptimal consequences on data quality and integrity, leading to inefficiencies for downstream data users. To address these problems, researchers at the University of California, Berkeley, have developed a framework and specific cluster analysis methods to efficiently extract knowledge from better APT data. By using parameter selection protocols with theoretical explanations, this technology allows for a more optimized and robust multivariate statistical analysis technique from the start, thus improving the quality of analysis and outcomes for both upstream and downstream data users.

*Principal Investigation: Name: Nathan Alexande Bailey
Department:

Name: Peter Martin Hosemann
Department:

欲了解更多信息，请点击这里