Media.Player

Cantilever-Based Optical Interfacial Force Microscope

技术优势

COIFM overcomes the persistent mechanical instability of the cantilever assembly near a sample surface in traditional AFM; the COIFM force-feedback technique prevents tip from snapping off. COIFM improves sensitivity by employing an optical detection scheme. The conventional IFM system is noisier due to its electrical detection scheme. The COIFM laser-and-position-sensor detector responds with greater precision. COIFM improves spatial resolution by using a cantilever-based probe with a nanometer scale diameter. COIFM achieves easier and more reliable force balance than the traditional magnetic force based balancing scheme. COIFM can be added to existing equipment.

详细技术说明

Boise State University has developed a cantilever based optical interfacial force microscope (COIFM) that utilizes a microactuated silicon cantilever and optical detection method to establish the measurement of single molecular interactions using the force feedback technique. The COIFM can measure single molecular interactions and bridges the gap between AFM and IFM based protocols.

*Abstract

Traditional microscope systems are generally unable to measure intermolecular interactions accurately and cost effectively. One type of microscope system is the atomic force microscope (AFM), which has been used to image and/or measure the topography of various surfaces. AFMΓÇÖs, however, suffer from a mechanical instability that prevents the accurate measurement of intermolecular interactions. Another type of microscope system is the interfacial force microscope (IFM). Traditional IFMΓÇÖs use an electrical detection process to measure various surface phenomena. IFMΓÇÖs, however, have not been widely used due to the low sensitivity and technical complexity of their electrical detection process. Thus, traditional microscope systems have generally been unable to measure intermolecular interactions accurately and cost effectively.

*Principal Investigation

Name: Byung Kim, Associate Professor

Department: Physics

附加资料

Inventor: Kim, Byung
Priority Number: US8549660B2
IPC Current: G01Q007014 | G01Q003014
US Class: 850015 | 850059
Assignee Applicant: Boise State University,Boise
Title: Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid
Usefulness: Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid
Novelty: Cantilever-based optical interfacial force microscope for micro electro mechanical system (MEMS) device, has feedback controller that applies voltage indicative of strength of interfacial force between sample substance and fiber probe

主要类别

电子

细分类别

电路设计

国家/地区

美国